Today I kept busy pretty much all day, which was good. This morning, I did some measurements on the grating particles and measured diameter of the particles. Then I processed some film, went to lunch, and later on scanned those images. Then I did some analysis on those asbestos samples and the electron defraction samples. I also worked on threshold adjustment techniques. I measured the equalized image particles compared to the gray scale image particles and adjusted the threshold accordingly. Then I did +/- 10 and +/- 20 of the threshold and observed the changes in the diameters of the particles. I realized that +/- 10 doesn't really make a difference, but +/- 20 can really make a difference in the diameters of the particles. That's all for now!
Subscribe to:
Post Comments (Atom)
No comments:
Post a Comment